Piezoresponse force microscopy of ferroelectric thin films

This thesis focuses on ferroelectric thin film characterization through Piezoresponse Force Microscopy (PFM) technique. During the last decades ferroelectric thin films have emerged as an interesting subject for nanoscale applications such as Micro- and Nano-Electromechanical Systems (MEMS and NEMS), and Ferroelectric Random Access Memories (FeRAM). These important technological applications have given a strong impetus to nanoscale characterization. In this respect, Piezoresponse force microscopy (PFM) has proven to be unique tool, enabling domain dynamics studies and detailed ferroelectric characterization at the nanoscales.

Zie: Summary

	Titel en inhoud
	Hoofdstuk 1
	Hoofdstuk 2
	Hoofdstuk 3
	Hoofdstuk 4
	Hoofdstuk 5
	Samenvatting
	Dankwoord
	Complete dissertatie

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