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Interface dislocation patterns studied with high-resolution TEM

(1999) Groen, Hilbrand Bastiaan

In many engineering applications materials are explored that contain both metals and ceramics. In order to describe the bonding mechanism between a metal and a ceramic material, heterophase interfaces were studied in this thesis with high-resolution electron microscopy. Herewith it is possible to image the atomic structure metal-oxide interfaces and to observe the local deformations of the lattice near the interface. The interfaces for observation were produced by internal oxidation to obtain many small oxide precipitates inside a metal matrix. In principle this method has the advantage to examine many interfaces inside the same sample. Furthermore, sample preparation has become easier because most likely interfaces that are suitable for detailed observations are present inside the transparent region. ...

Zie: Samenvatting




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Gebruik a.u.b. deze link om te verwijzen naar dit document:
http://irs.ub.rug.nl/ppn/186560354

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